2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada

Author: Yashwant K. Malaiya
Edition: 2000
Publisher: Ieee
Binding: Paperback
ISBN: 0769506372
Category: Programming
List Price: $ 100.00
Price: $ 100.00
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2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada : Proceedings

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